Fabrication of gate dielectric in nonvolatile memories having select, floating and control gates

ABSTRACT

In a nonvolatile memory, one or more peripheral transistor gates are formed from the same layer ( 140 ) as the select gate. The gate dielectric ( 130 ) for these peripheral transistors and the gate dielectric ( 130 ) for the select gates are formed simultaneously. In a nonvolatile memory, the gate dielectric ( 130 ) for the peripheral transistors and the gate dielectric ( 130 ) for the select gates ( 140 ) have the same thickness. Portions of the control gates ( 170 ) overlie the select gates.

BACKGROUND OF THE INVENTION

The present invention relates to nonvolatile memories.

FIG. 1 illustrates a flash memory cell 110 described in U.S. Pat. No.6,057,575 issued May 2, 2000 to Jenq. The cell is formed in and over asemiconductor substrate 120. Silicon dioxide 130 is thermally grown onsubstrate 120 to a thickness of 180 Å. Select gate 140 is formed onoxide 130. Silicon dioxide 150 (100 Å) is thermally grown on a region ofsubstrate 120 not covered by the select gate. ONO 154 (a sandwich of alayer of silicon dioxide, a layer of silicon nitride, and another layerof silicon dioxide) is formed on select gate 140. Floating gate 160 isformed on dielectric layers 150, 154. A portion of floating gate 160overlies the select gate 140.

ONO layer 164 is formed on the floating and select gates. Control gate170 is formed on ONO 164. The control gate overlies floating gate 160and select gate 140.

N+ source and drain regions 174, 178 are formed in substrate 120.

FIG. 2 shows a circuit diagram of a memory array of cells 110. This is aNOR array. Each cell is shown schematically as a floating gatetransistor and a select transistor connected in series. Select gatelines 140, control gate lines 170, and source lines 178 extend in therow direction (Y direction) throughout the array. Each select gate line140 provides the select gates for one row of the array. Each controlgate line 170 provides the control gates for one row. Each source line178 is connected to source/drain regions 178 of two adjacent rows (herethe same numeral 178 is used for the source lines and the source/drainregions). Bitlines 180 extend in the column direction (X direction).Each bitline 180 is connected to the regions 174 of two adjacentcolumns.

A cell 110 is programmed by hot electron injection from the cell'schannel region (the P type region in substrate 120 below the cell'sfloating and select gates) to floating gate 160. The cell is erased byFowler-Nordheim tunneling of electrons from floating gate 160 to sourceline region 178. The cell is read by sensing a current on thecorresponding bitline region 174.

The memory includes peripheral circuitry (not shown) including decoders,sense amplifiers, high voltage generators, and other circuits used forthe memory access. It is desirable to provide improved manufacturingtechniques for fabricating the memory and the peripheral circuits.

SUMMARY

This section summarizes some features of the invention. Other featuresare described in the subsequent sections. The invention is defined bythe appended claims which are incorporated into this section byreference.

In some embodiments of the present invention, one or more peripheraltransistor gates are formed from the same layer as the select gate. Thegate dielectric for these peripheral transistors and the gate dielectricfor the select gates (such as dielectric 130 in FIG. 1) are formedsimultaneously. Elimination of separate processing steps to form thegate dielectric for these peripheral transistors advantageously reducesthe overall thermal processing involved in the memory fabrication.

In some embodiments, these peripheral transistors are high voltagetransistors. High voltage transistors are transistors exposed to superhigh voltages. “Super high voltages” are voltages of a higher magnitudethan the voltages provided to a memory cell in a read operation. Forexample, suppose the read voltages are all in the range from Vss to Vcc,where Vss is ground, and Vcc is a power supply voltage (received from anexternal power supply or generated internally) of 3.0V. Then a superhigh voltage is a voltage of a magnitude above 3.0V.

High voltage transistors may need a fairly thick gate dielectric. Selectgates may also need a thick dielectric. In some embodiments, the memoryis erased through the channel region. In the erase operation, thevoltage between the substrate and the select gate is super high, so theselect gate dielectric is made thick to sustain this voltage. The selectgate dielectric matches the dielectric thickness of the high voltagetransistors.

In some embodiments, the select gate dielectric is thicker than thedielectric underlying the floating gates (such as dielectric 150 in FIG.1). In some embodiments, the memory includes peripheral transistors withdifferent gate dielectric thicknesses, and the select gate dielectric isat least as thick as any peripheral transistor gate dielectric.

Other features and embodiments of the invention are described below. Theinvention is defined by the appended claims.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a vertical cross section of a prior art flash memory cell.

FIG. 2 is a circuit diagram of a prior art memory array.

FIG. 3 is a top view of a memory array according to an embodiment of thepresent invention.

FIGS. 4, 5A, 5B, 6A, 6B, 7A, 7B, 8, 9, 10, 11A, 11B, 12, 13A, 13B, 14,15A, 15B, 16, 17A, 17B 18, 19A, 19B, 20A, 20B, 21A, 21B, 22, 23A, 23B,24A, 24B, 25A-25C show vertical cross sections of integrated circuitstructures according to embodiments of the present invention.

FIG. 25D is a top view of an integrated circuit structure according toan embodiment of the present invention.

FIG. 25E shows a vertical cross section of an integrated circuitstructure according to an embodiment of the present invention.

FIG. 25F is a top view of an integrated circuit structure according toan embodiment of the present invention.

DESCRIPTION OF SOME EMBODIMENTS

The embodiments described in this section illustrate but do not limitthe invention. The invention is not limited to particular materials,processing steps, or dimensions. The invention is defined by theappended claims.

One memory embodiment of the present invention is shown in top view inFIG. 3. The memory circuit diagram is identical to that of FIG. 2.Select gate lines 140, control gate lines 170, and source lines 178 runthrough the memory array in the Y direction (row direction). Thebitlines (not shown) run in the X direction (column direction). Thebitlines contact the corresponding source/drain regions 174 (“bitlineregions”) in areas 174C marked with a cross. Floating gates 160 aremarked with dashed crosses. In this embodiment, the floating gates donot overlie the select gates. Control gate lines 170 overlap the selectgates. Each dashed line 140E marks an edge of a select gate line 140under a control gate line 170. Each control gate line 170 has an edge170E1 overlying a select gate line 140, and another edge 170E2 whichdoes not overlie the select gate line but runs at some distance D fromthe select gate line. The edges 170E2 and the distance D can be definedin a self-aligned manner as explained below. The edges 170E2 also definethe edges of the floating gates 160 on the side of bitline regions 174.The floating gates can be completely self-aligned (i.e. definedindependently of photolithographic alignment), as described below.

In FIG. 3, floating gates 160 are adjacent to bitline regions 174, notto source line regions 178 as in FIG. 1. The increased distance betweenthe floating gates and the source lines makes it possible to increasethe source line doping concentration, and thus reduce the source lineresistance, because the electrons are less likely to leak from thesource lines to the floating gates. Further, in some embodiments, thememory cells are erased through the channel region. The exemplaryvoltages are given in Table 1 below. The voltage difference between thesource line region 178 and select gate 140 is fairly low (at most about6V in Table 1, for the erase operation). Therefore, the current leakagebetween source line 178 and select gate 140 is low. Further, the voltagedifference between the source line 178 and the substrate 120 (P well120W) is at most a diode drop (during the erase operation), so thesource line junction breakdown is unlikely. Consequently, the sourceline doping can be increased to reduce the sheet resistance. Theinvention is not limited to such embodiments however. For example, thefloating gates can be adjacent to the source lines. The memory can beerased through source lines 178 or bitline regions 174.

Substrate isolation trenches 220T run through the array in the Xdirection. Trenches 220T are filled with dielectric 220, but dielectric220 is etched out of the trenches at the location of source lines 178.Active areas 222 run through the array between the trenches 220T. Eachactive area 222 includes active areas of individual cells in one memorycolumn. The active area of each cell consists of the cell's source/drainregions 174 and 178 and the P type channel region extending between theregions 174, 178. Numeral 178 denotes both a source line and asource/drain region (“source line region”) of one memory cell.

Some of the figures below illustrate vertical cross sections ofintermediate structures obtained during the memory fabrication. Thesectional planes are indicated in FIG. 3 by lines X1-X1′, X2-X2′,Y1-Y1′, and Y2-Y2′. The line X1-X1′ runs in the X direction through anactive area 222. The line X2-X2′ runs in the X direction through atrench 220T. The line Y1-Y1′ runs in the Y direction through a selectgate line 140. The line Y2-Y2′ runs in the Y direction through a controlgate line 170 and floating gates 160.

In one embodiment, the memory is fabricated as follows. Substrateisolation regions 220 are formed in P doped substrate 120 by shallowtrench isolation technology (“STI”). See FIG. 4 (cross section Y1-Y1′).Each region 220 is a dielectric region formed in a trench 220T. SuitableSTI processes are described in U.S. Pat. No. 6,355,524 issued Mar. 12,2002 to Tuan et al.; U.S. patent application Ser. No. 10/262,785 filedOct. 1, 2002 by Yi Ding; and U.S. patent application Ser. No. 10/266,378filed Oct. 7, 2002 by C. Hsiao, all incorporated herein by reference.Other STI and non-STI processes are also possible. We will sometimerefer to dielectric 220 as “STI oxide” because it is silicon dioxide insome embodiments. The invention is not limited to such embodiments or tosilicon integrated circuits.

Substrate isolation regions are also formed in the memory peripheralarea (not shown in FIG. 4). The peripheral area contains circuitryneeded to access the memory, and may also contain unrelated circuitry(the memory may be embedded into a larger system).

As shown in FIG. 4, oxide 220 protrudes above the substrate 120. Theprotruding portions are shown at 220P. An exemplary thickness ofportions 220P is 0.12 μm for a 0.18 μm fabrication process (a processwith a 0.18 μm minimum line width). The exemplary dimensions given inthis section assume a 0.18 μm fabrication process unless mentionedotherwise.

Dopant is implanted into substrate 120 to form an N type region 604underlying the memory array. Dopant is also implanted into the substratearound the array to form a surrounding N type region (not shown)extending from the top surface of substrate 120 down to region 604.These implants create a fully isolated P well 120W for the memory array.Region 604 is not shown in the subsequent drawings, and the P well 120Wis shown simply as substrate 120.

Silicon dioxide 130 (FIG. 5A, cross section Y1-Y1′, and FIG. 5B,periphery) is thermally grown on the exposed areas of substrate 120 toprovide gate dielectric for the select gates of the memory array and forthe peripheral transistors. An exemplary thickness of oxide 130 in thearray area is 120 Å. Generally, the oxide thickness depends on themaximum voltage that the oxide 130 is designed to sustain during thememory operation.

In the example shown in FIG. 5B, the peripheral area includes a highvoltage transistor area 512H and a low voltage transistor area 512L.Oxide 130 is grown thermally to a thickness of 60 Å over the entirewafer. This oxide is removed from the low voltage area 512L by a maskedetch. The wafer is re-oxidized to re-grow silicon dioxide in area 512Lto a thickness of 60 Å. The oxide thickness in the memory array area andin high voltage area 512H increases from 60 Å to 120 Å during this step.

Thus, oxide 130 in the array area and oxide 130 in the high voltageperipheral area 512H is formed simultaneously in these two oxidationsteps. The oxide 130 in area 512L and the oxide 130 in the array areaand area 512H are not formed simultaneously because the oxide 130 inarea 512L is formed in the second oxidation step.

As shown in FIG. 6A (cross section Y1-Y1′) and FIG. 6B (periphery),intrinsic polysilicon layer 140 is formed over the structure by aconformal deposition process (e.g. low pressure chemical vapordeposition, “LPCVD”). Polysilicon 140 fills the spaces between the oxideprotrusions 220P in the memory array area. The top polysilicon surfaceis planar because the polysilicon portions deposited on the sidewalls ofprotrusions 220P meet together.

FIG. 6B may represent either the low voltage or the high voltagetransistor area. In some embodiments, there are more than two peripheralareas with different gate oxide thicknesses, and FIG. 6B may representany of these areas.

Polysilicon 140 covers the regions 120 i (FIG. 6B) at the interfacebetween substrate 120 and field oxide 220 in the peripheral area.Polysilicon 140 will protect the oxide 220 in this area to preventformation of grooves (“divots”) during subsequent processing.Polysilicon 140 will be used to form the peripheral transistor gates.The grooving in regions 120 i under the transistor gates is undesirablebecause it degrades the transistor characteristics.

Non-conformal deposition processes, whether known or to be invented, canalso be used for layer 140. If the top surface of polysilicon 140 is notplanar, it is believed that the polysilicon 140 can be planarized usingknown techniques (e.g. CMP, or spinning a photoresist layer over thepolysilicon 140 and then simultaneously etching the resist and thepolysilicon at equal etch rates until all of the photoresist isremoved). The bottom surface of polysilicon 140 is non-planar as it goesup and down over the oxide protrusions 220P.

An exemplary final thickness of polysilicon 140 is 0.16 μm over theactive areas.

Silicon dioxide layer 780 (FIG. 6B) is formed over the wafer, by TEOSCVD for example, to a thickness of 400-500 Å. This layer will serve asan etch stop in a silicon nitride etch. Optionally, oxide 780 is removedfrom the array area by a masked etch.

The peripheral area is masked, and polysilicon 140 is doped N+in thearray area. Polysilicon 140 remains undoped (“INTR”, i.e. intrinsic) inthe periphery. The peripheral transistor gates will be doped later, withthe NMOS gates doped N+ and the PMOS gates P+, to fabricate surfacechannel transistors in the periphery with appropriate thresholdvoltages. The invention is not limited to the surface channeltransistors or any peripheral processing. In particular, entirepolysilicon 140 can be doped N+ or P+after the deposition or in situ.

Silicon nitride 810 is deposited on polysilicon 140, by LPCVD forexample, to an exemplary thickness of 1500 Å. If desired, a pad oxidelayer (not shown) can be formed on polysilicon 140 before the nitridedeposition. The pad oxide layer will provide an additional protectionfor the select gates during the patterning of control gate polysilicon170 described below.

In some embodiments, the top surface of polysilicon 140 and/or nitride810 is not planar.

The wafer is coated with a photoresist layer 820. See FIG. 7A, crosssection X1-X1′, and FIG. 7B, periphery. (FIG. 7B shows only the activearea, not the field oxide 220.) Resist 820 is patterned to define theselect gate lines 140. The peripheral area is covered by the resist.Edges 140E of select gate lines 140 are adjacent to the future positionsof source lines 178. The memory array geometry is not sensitive to amisalignment between mask 820 and the mask defining the isolationtrenches 220T (FIG. 3) except possibly at the boundary of the memoryarray.

Silicon nitride 810 is etched through the resist openings. The resist isremoved, and polysilicon 140 is etched away where exposed by nitride810. Then the exposed oxide 130 is removed. The select gate lines areformed as a result. (In an alternative embodiment, the resist definingthe nitride 810 is removed after the etch of polysilicon 140 and/oroxide 130.)

As shown in FIG. 8 (cross section X1-X1′), the structure is oxidized togrow silicon dioxide 150 on substrate 120 and the sidewalls ofpolysilicon gates 140 in the array area. Oxide 150 will serve as tunneloxide on substrate 120, and will provide sidewall insulation for theselect gates. The oxide thickness depends on the dopants and dopantconcentrations. In one embodiment, oxide 150 is 90 Å thick on substrate120, and is 300 Å thick on the select gate sidewalls. The peripheralarea is covered by nitride 810 (FIG. 6B), and remains substantiallyunchanged during this step.

Floating gate polysilicon 160 (FIG. 9, cross section X1-X1′) isdeposited over the structure, by LPCVD for example, and is doped duringor after the deposition. Polysilicon 160 is sufficiently thick to ensurethat its top surface is at least as high throughout the wafer as the topsurface of nitride 810. In the embodiment of FIG. 9, the top surface oflayer 160 is planar due to a conformal deposition to a thickness largerthan half the distance between the adjacent select gate lines 140. Inone embodiment, the distance between select gate lines 140 over thefuture positions of bitline regions 174 is 0.8 μm, and the polysilicon160 is more than 0.4 μm thick.

If the top surface of polysilicon 160 is not planar, it is planarized byCMP or a suitable etch.

After planarization (if needed), layer 160 is etched down without amask. The etch end point is when STI oxide 220 becomes exposed. FIG. 10(cross section X1-X1′) shows an intermediate stage in this etch, whennitride 810 becomes exposed. At this stage, layer 160 has been removedfrom the periphery, so the periphery becomes as in FIG. 6B.

FIG. 11A (cross section X1-X1′) and 11B (cross section Y2-Y2′) show thearray area at the end of the polysilicon etch. The polysilicon has beenremoved from the top surface of oxide 220. In some embodiments, thefinal thickness of layer 160 is 1200 Å. The etch is selective to nitride810.

Optionally, a timed etch of oxide 220 is performed to recess the topsurface of oxide 220 below the surface of polysilicon 160. See FIG. 12(cross section Y2-Y2′). This etch will improve the capacitive couplingbetween the floating and control gates. See the aforementioned U.S. Pat.No. 6,355,524. In the embodiment of FIG. 12, the oxide 220 continues toprotrude above the top surface of substrate 120 by at least 0.10 μm. Inother embodiments, the oxide 220 does not protrude above the substrateafter the etch (the top surface of layer 220 is level with the topsurface of the substrate after the oxide etch).

ONO layer 164 (FIG. 13A, cross section X1-X1′, and FIG. 13B, periphery)is formed over the structure. Control gate polysilicon layer 170 isdeposited on ONO 164 and is doped during or after the deposition.

The top surface of polysilicon 170 is not planar in the array area.Layer 170 has protrusions 170.1 over the select gate lines 140. Cavities17° C. form in layer 170 between protrusions 170.1 over the futurepositions of bitline regions 174. The protrusions 170.1 will be used todefine the overlap between the floating and control gates withoutadditional dependence on photolithographic alignment.

In FIG. 13A, polysilicon 170 is substantially planar over the futurepositions of source lines 178 because the source lines 178 are fairlynarrow (0.22 μm width in some embodiments) and layer 170 is relativelythick (e.g. 0.18 μm). In other embodiments, the layer 170 is not planarover the source lines 178, and a cavity 170C forms over each sourceline. The topography of layer 170 depends on the underlying topography,the thickness of polysilicon 170, and the polysilicon depositionprocess.

As shown in FIG. 14 (cross section X1-X1′), a layer 1710 is depositedover the structure and etched without a mask to expose the polysilicon170. Layer 1710 fills the cavities 170C. When layer 1710 is etched inthe array area, layer 1710 is removed in the periphery, so the peripherybecomes as in FIG. 13B. In one embodiment, layer 1710 is silicon nitridedeposited to have a planar top surface or planarized during the etch.

In some embodiments, the etch of nitride 1710 continues after theexposure of polysilicon 170, and the nitride etch exposes the sidewallsof polysilicon protrusions 170.1 (FIG. 13A). Whether or not thepolysilicon sidewalls are exposed, the exposed edges of polysilicon 170define the control gate edges 170E2 (FIG. 3) as described below.Therefore, the edges 170E2 and the distance D are defined without resortto photolithography. In some embodiments, D=0.18 μm. The overlap betweenthe floating and control gates is also defined without photolithography.

The wafer is oxidized to grow silicon dioxide 1720 on the exposedpolysilicon 170. See FIG. 15A (cross section X1-X1′) and FIG. 15B(periphery). An exemplary thickness of oxide 1720 is 500 Å.

In some embodiments, layer 1720 is some other material formedselectively on polysilicon 170. For example, layer 1720 can be aconductive metal silicide formed by a salicide (self-alignedsilicidation) technique.

The wafer is coated with photoresist 1730 (FIG. 16, cross sectionX1-X1′). Openings are formed in the resist over the future positions ofsource lines 178. The location of the longitudinal edges of mask 1730 isthe location of the future positions of control gate edges 170E1 (seealso FIG. 3). These edges can be located anywhere over select gate lines140. The resist is removed from the peripheral area.

Oxide 1720 and at least a portion of polysilicon 170 are removed whereexposed by resist 1730. See FIG. 17A, cross section X1-X1′, and FIG.17B, periphery. The etch of polysilicon 170 may stop when ONO 164 isexposed, or may continue after the exposure of ONO 164. In either case,polysilicon 170 is etched away in the periphery. When ONO 164 isexposed, the etch may continue for a predetermined time (a timed etch),or may continue until all of the exposed polysilicon 170 is removed. Inone embodiment, the polysilicon etch is a timed etch reducing thethickness of polysilicon 170 over the source lines to about 0.18 μm.

Resist 1730 and nitride 1710 are removed. The resulting structure isshown in FIG. 18 (cross section X1-X1′). The periphery remains as inFIG. 17B.

Polysilicon 170, ONO 164, and polysilicon 160 are etched with oxide 1720as a mask. The resulting structure is shown in FIG. 19A (cross sectionX1-X1′) and FIG. 19B (periphery). In some embodiments, the polysiliconetch of layers 170, 160 is anisotropic, and the etch of ONO 164 isisotropic or anisotropic. The etch of ONO 164 may remove portions ofoxide 1720 and/or nitride 810, and may also remove some oxide 150 on thesidewalls of select gate lines 140.

The wafer is coated with photoresist 2620 (FIG. 20A, cross sectionX1-X1′). The resist is patterned to expose the source lines 178. Eachsource line 178 traverses the memory array between two adjacent controlgate lines 170, and provides one source/drain region to each cell in thetwo rows associated with the two control gate lines. The edges of theresist openings can be positioned anywhere over select gate lines 140 orfloating gates 160. The periphery is covered by the resist.

Silicon dioxide 220 is etched out of trenches 220T in the areas exposedby resist mask 2620 (FIG. 20B, cross section X2-X2′). This etch removesoxide 150 in the active areas over the source lines (FIG. 20A). Thisetch may also remove the exposed portions oxide 1720 if oxide 1720 isnot entirely covered by the resist. Then the source line implant (N+) isperformed using the same mask. In some embodiments, this is a highenergy, high dose implant, possibly preceded by a lower energy, lowdose, large angled implant (the angle can be 10° to 30° for example), toachieve a 0.1 μm to 0.2 μm source line diffusion depth.

In an alternative embodiment when the resist mask 2620 has been formed,a high energy N+ implant is performed before the etch of oxide 220, thenoxide 220 is etched out of the trenches using the same mask, and thenanother, lower energy N type implant is performed using the same mask.The first (high energy) implant is at least partially blocked by oxide220 in the trenches to avoid shorting the source lines 178 to N typeisolation region 604 (FIG. 4). See the aforementioned U.S. Pat. No.6,355,524.

Resist 2620 is removed. Another photoresist layer (not shown) is formedover the wafer and patterned to cover the array but expose the entireperiphery. Then nitride 810 (FIG. 19B) is etched away from theperipheral area. Oxide 780 serves as an etch stop during the nitrideetch. Then oxide 780 is removed.

The resist covering the array is removed, and another photoresist layer(not shown) is formed to cover the array and define the peripheraltransistor gates. Polysilicon 140 is etched away where exposed by thisresist.

The resist is removed. The wafer is coated with a photoresist layer 2720(FIG. 21B, periphery). The resist is patterned to expose the entirearray area (FIG. 21A, cross section X1-X1′) and also to expose theperipheral NMOS transistor regions. FIG. 21B shows a peripheral NMOStransistor region 512N with a P well 2724P, and a peripheral PMOStransistor region 512P with an N well 2724N. These wells were definedbefore formation of oxide 130. There can be many regions 512N, 512P inthe integrated circuit. Resist 2720 covers the PMOS transistor regions512P. An N type implant (N−) is performed to form the LDD (lightly dopeddrain) extensions for peripheral NMOS source/drain regions 2730N (FIG.21B). This implant also dopes the NMOS gates 140 in the periphery. Inaddition, the implant dopes bitline regions 174 (FIG. 21A) and increasesthe dopant concentration in source lines 178.

In some embodiments, the memory array is not exposed by resist 2720, andno doping is performed in the source lines and the bitline regions atthis step.

Resist 2720 is removed, and another photoresist layer 2820 (FIG. 22,periphery) is formed to cover the NMOS peripheral transistor regions512N and the memory array. A P type implant (P−) is performed to formthe LDD extensions for PMOS source/drain regions 2730P and to dope theperipheral PMOS transistor gates.

Resist 2820 is removed. A thin silicon dioxide layer 2904 (see FIG. 23A,cross section X1-X1′, and FIG. 23B, periphery) is grown on the exposedsilicon surfaces of layers 140, 160, 170 by a rapid thermal oxidationprocess (RTO). Alternative techniques can also be used such as chemicalvapor deposition (e.g. TEOS CVD), a high temperature oxide process(HTO), or other suitable techniques, known or to be invented. Thesetechniques may form the oxide 2904 over the entire structure and notonly on the silicon surfaces. An exemplary thickness of oxide 2904 is100 Å.

A thin silicon nitride layer 2910 is deposited and etchedanisotropically without a mask to form sidewall spacers over the gatestructures. The etch of nitride 2910 may remove some of nitride 810 inthe array area (FIG. 23A). If oxide 2904 was deposited over the entirestructure (by TEOS CVD or HTO for example), oxide 2904 will help protectthe substrate 120 during the nitride etch. Spacers 2910 meet over thesource lines 178 and create a thick nitride layer over the source lines.In other embodiments, the spacers do not meet over the source lines.

Then N+ and P+ implants are performed to create source/drain structuresfor the peripheral transistors and the bitline regions 174. Moreparticularly, the peripheral PMOS transistor area 512P is masked withresist (not shown), and an N+implant is performed to create thesource/drain structures for bitline regions 174 and the peripheral NMOStransistors and increase the dopant concentration in the peripheral NMOSgates 140. The floating, control and select gates and the overlyingnitride layers mask this implant so no additional masking in the arrayarea is needed.

The resist is removed. The array and the peripheral NMOS transistorregions 512N are masked with a resist (not shown), and a P+implant isperformed to create the source/drain structures for the peripheral PMOStransistors and increases the dopant concentration in the PMOStransistor gates 140.

The resist is removed. A silicon dioxide etch is performed to remove theoxide 1720 and expose the control gate lines 170 (FIG. 24A, crosssection X1-X1′). This etch also removes the exposed portions of oxide150 over bitline regions 174 in the array area, the exposed oxide 130over source/drain regions 2730N, 2730P in the periphery (see FIG. 24B),and the oxide 2904 over the peripheral transistor gates.

A conductive metal silicide layer 2920 is formed by a self-alignedsilicidation (salicide) process on the exposed silicon surfaces ofcontrol gate lines 170, bitline regions 174, peripheral transistor gates140 and peripheral source/drain regions 2730N, 2730P. The salicideprocess involves depositing a metal layer, heating the structure toreact the metal with the silicon, and removing the unreacted metal. Thiscan be followed by an anneal or any other suitable processing, known orto be invented, to improve the silicide properties (e.g. increase itsconductivity). Titanium, cobalt, nickel, and other conductive materials,known or to be invented, can be used for the metal layer. Non-salicideselective deposition techniques, known or to be invented, thatselectively form a conductive layer 2920 on the exposed silicon but noton a non-silicon surface, can also be used.

As noted above in connection with FIG. 15, layer 1720 can be aconductive metal silicide formed by a salicide process. In this case,layer 1720 does not have to be removed. The silicidation process of FIG.24A will silicide the bitline regions 174, the peripheral gates 140 andthe peripheral source/drain regions 2730.

As shown in FIG. 25A (cross section X1-X1′) and FIGS. 25B and 25C(periphery), inter-level dielectric 3204 is deposited over the wafer.FIG. 25C shows only an NMOS transistor region, but the PMOS regions aresimilar. See also FIG. 25E showing an array cross section X3-X3′described below in connection with FIG. 25F. Contact openings are etchedin dielectric 3204 to expose the silicided surfaces of bitline regions174 (FIG. 25A), source/drain regions 2730P and 2730N (FIG. 25B),peripheral gates 140 (FIG. 25C), and control gates 170 (FIG. 25E). Thesilicide 2920 protects the bitline regions 174 and the source/drainregions 2730 during this etch. A conductive layer 3210 (e.g. metal) isdeposited and patterned to form the bitlines 180 and possibly otherfeatures. The figures also show an optional metal layer 3220 (e.g.tungsten) used to fill the contact openings before the deposition oflayer 3210.

FIG. 25D (top view) shows an extension of a peripheral transistor gate140 over STI oxide 220. The extension can be made to form a contact tothe gate or for some other reason (e.g. to connect the gate to otherfeatures). The region 120 i at the interface between the substrate 120and field oxide 220 is protected from the divot formation because thegate is formed using the first polysilicon layer 140. See also FIG. 6B.The transistor of FIG. 25D can be a high voltage transistor (in area512H in FIG. 5B) or a low voltage transistor (in area 512L).

FIGS. 25E, 25F illustrate the boundary of the memory array. Contacts tocontrol gate lines 170 and select gate lines 140 are formed in thisarea. FIG. 25F is a top view, and FIG. 25E illustrates a vertical crosssection along the line X3-X3′ in FIG. 25F. The line X3-X3′ passesthrough control gate contact opening 170CT formed in dielectric 3204.Control gate contact opening 170CT and select gate contact opening 140Care formed over STI oxide 220. Control gate line 170 has a widenedportion 170X to accommodate the contact opening 170CT. Select gate line140 has a widened portion 140X1 to accommodate the select gate contactopening 140C.

Select gate line 140 has another widened portion 140X2 under the widenedportion 170X of the control gate line. The portion 170X is created in aself-aligned manner by the widened portion 140X2. As shown in FIGS. 3,14, and 19A, the control gate edge 170E2 follows the select gate edge140E at the distance D from the select gate. The distance D is definedwithout photolithography as explained above. The select gate edges aredefined by mask 820 (FIG. 7A). The select gate edges are straight edgesin this embodiment, but in the area shown in FIG. 25F the edge 140Edeviates from the straight line to widen the select gate to form theregion 140X2. Consequently, the control gate edge 170E2 deviates fromthe straight line to form the widened region 170X in a self-alignedmanner.

Other details of the memory fabrication process for one embodiment aregiven in U.S. patent application Ser. No. 10/393,212 “NONVOLATILEMEMORIES ANT) METHODS OF FABRICATION” filed Mar. 19, 2003 by Yi Ding andincorporated herein by reference.

In one embodiment, the memory cells 110 are programmed by channel hotelectron injection. The corresponding select gate 140 is held at avoltage sufficiently high to invert the underlying portion of the cell'schannel region. Control gate 170 is driven high relative to substrate120 to raise the voltage on floating gate 160 relative to the channelregion and invert the channel region under the floating gate. A voltagedifference is provided between the source/drain regions 174, 178 toinduce a current and cause the hot electron injection from the channelregion into the floating gate. The cells are erased by Fowler-Nordheimtunneling through the channel regions (“bulk erase”). The cells are readby sensing a current on bitlines 180 when the select gate 140 is at ahigh enough voltage to invert the underlying portion of the channelregion, the control gate 170 is at an appropriate voltage to invert theunderlying portion of the channel region if, and only if, the cell iserased, and a voltage difference is induced between the source/drainregions 174, 178. Exemplary voltages are shown below in Table 1. Vcc isassumed to be 2.7V to 3.6V. “Selected” means the memory cell is selectedby the address signals. Of note, a select gate line, a control gateline, or other lines can be shared by both selected and unselectedmemory cells. In such cases, the “selected” voltages apply.

TABLE 1 SG 140 CG 170 BL 180 SL 178 P well 120 W Read Selected: Vcc Vcc1.0 V 0 V 0 V Not selected:   0 V    0 V   0 V 0 V 0 V Program Selected:2.0 V  10.0 V   6 V 0 V 0 V Not selected:   0 V    0 V Vcc 0 V 0 VErase: 2.0 V −10.0 V Float Float 8 V

The invention is not limited to any particular read, erase orprogramming techniques, to NOR memory arrays, LDD structures, to aparticular array architecture or fabrication method, or to particularvoltages. For example, the memory can be powered by multiple powersupply voltages. Floating gates 160 (FIG. 3) can be defined using amasked etch, and can extend over sidewalls of select gate lines 140. SeeU.S. patent application Ser. No. 10/411,813 filed by Yi Ding on Apr. 10,2003 and incorporated herein by reference. The source lines can beformed from a layer overlying the substrate 120 and contacting thesource line substrate regions 178; the source lines do not have to go upand down the isolation trenches 220T. Also, substrate isolation regions220 do not have to traverse the entire array. The invention isapplicable to non-flash memories (e.g. non-flash EEPROMs) and tomulti-level memory cells (such a cell can store multiple bits ofinformation). Other embodiments and variations are within the scope ofthe invention, as defined by the appended claims.

1. A method for fabricating an integrated circuit comprising anonvolatile memory comprising a nonvolatile memory cell comprising afloating gate, a select gate, and a control gate, the nonvolatile memoryfurther comprising a first peripheral transistor, the method comprising:(a) forming a dielectric layer on a semiconductor substrate, thedielectric layer comprising a first dielectric region (“select gatedielectric”) and a second dielectric region (“first peripheraltransistor gate dielectric”), wherein the select gate dielectric and thefirst peripheral transistor gate dielectric are formed simultaneously;(b) forming a first layer over the dielectric layer and patterning thefirst layer to provide (i) the select gate on the select gatedielectric, and (ii) a gate for the first peripheral transistor on thefirst peripheral transistor gate dielectric; (c) after the operation(b), forming the floating gate and the control gate for the memory cell;wherein the select gate dielectric as at least as thick as a gatedielectric of any peripheral transistor in said memory.
 2. The method ofclaim 1 wherein the memory cell comprises a channel region in thesemiconductor substrate, the select gate controls a conductivity of aportion of the channel region, and the floating gate overlies anotherportion of the channel region.
 3. The method of claim 2 wherein thecontrol gate overlies the floating gate.
 4. The method of claim 1wherein the operation (b) comprises forming a plurality of layers overthe semiconductor substrate, wherein the floating gate and the controlgate are formed from the plurality of layers.
 5. The method of claim 1wherein the select gate dielectric and the first peripheral transistorgate dielectric are formed by oxidation of the semiconductor substrate.6. The method of claim 5 wherein the select gate dielectric and thefirst peripheral transistor gate dielectric consist of silicon oxide. 7.The method of claim 1 further comprising, after the operation (b),forming a dielectric (“floating gate dielectric”) on the semiconductorsubstrate to separate the floating gate from the substrate, wherein thefloating gate dielectric is formed of the same material as the selectgate dielectric but is thinner than the select gate dielectric.
 8. Themethod of claim 1 further comprising forming a second peripheraltransistor gate dielectric on the semiconductor substrate for a secondperipheral transistor, and forming a gate of the second peripheraltransistor on the second peripheral transistor gate dielectric, whereinthe second peripheral transistor gate dielectric is made from the samematerial as the select gate transistor gate dielectric and the firstperipheral transistor gate dielectric but the thickness of the secondperipheral transistor gate dielectric is different from the thickness ofthe first peripheral transistor gate dielectric.
 9. The method of claim8 wherein the second peripheral transistor gate dielectric is thinnerthan the first peripheral transistor gate dielectric.
 10. The method ofclaim 8 wherein the select gate dielectric as at least as thick as agate dielectric of any peripheral transistor in said memory.
 11. Themethod of claim 8 wherein the second peripheral transistor gatedielectric is formed after the start of the operation (a).
 12. Themethod of claim 8 wherein the second peripheral transistor gatedielectric is formed before the operation (b).
 13. The method of claim 8wherein the gate of the second peripheral transistor is formed bypatterning the first layer in the operation (b).
 14. The method of claim1 wherein the memory cell is one of a plurality of nonvolatile memorycells of said memory, each memory cell comprising a floating gate, aselect gate, and a control gate, wherein: the operation (a)simultaneously forms select gate dielectric for each of the memorycells; and the operation (b) simultaneously forms the select gate foreach of the memory cells on the corresponding select gate dielectric.15. The method of claim 1 wherein during a memory cell writingoperation, the first peripheral transistor is exposed to a voltage of ahigher magnitude than any voltage provided to the memory cell in areading operation.
 16. The method of claim 15 wherein during the memorycell writing operation, the first peripheral transistor is exposed to avoltage of a higher magnitude than any power supply voltage provided tothe nonvolatile memory.
 17. The method of claim 1 wherein the memory isto support a writing operation in which the memory cell is written by atransfer of a charge between the floating gate and a channel region ofthe memory cell, the channel region being located in the semiconductorsubstrate.
 18. A method for fabricating an integrated circuit comprisinga nonvolatile memory comprising a nonvolatile memory cell comprising afloating gate, a select gate, and a control gate, the nonvolatile memoryfurther comprising a first peripheral transistor, the method comprising:(a) forming a dielectric layer on a semiconductor substrate, thedielectric layer comprising a first dielectric region (“select gatedielectric”) and a second dielectric region (“first peripheraltransistor gate dielectric”), wherein the select gate dielectric and thefirst peripheral transistor gate dielectric are formed simultaneously;(b) forming a first layer over the dielectric layer and patterning thefirst layer to provide (i) the select gate on the select gatedielectric, and (ii) a gate for the first peripheral transistor on thefirst peripheral transistor gate dielectric; (c) after the operation(b), forming the floating gate and the control gate for the memory cell;wherein the method further comprises forming a second peripheraltransistor gate dielectric on the semiconductor substrate for a secondperipheral transistor, and forming a gate of the second peripheraltransistor on the second peripheral transistor gate dielectric, whereinthe second peripheral transistor gate dielectric is made from the samematerial as the select gate transistor gate dielectric and the firstperipheral transistor gate dielectric but the thickness of the secondperipheral transistor gate dielectric is different from the thickness ofthe first peripheral transistor gate dielectric; wherein the secondperipheral transistor gate dielectric is formed after the start of theoperation (a).
 19. The method of claim 18 wherein the memory cellcomprises a channel region in the semiconductor substrate, the selectgate controls a conductivity of a portion of the channel region, and thefloating gate overlies another portion of the channel region.
 20. Themethod of claim 19 wherein the control gate overlies the floating gate.21. The method of claim 18 wherein the operation (b) comprises forming aplurality of layers over the semiconductor substrate, wherein thefloating gate and the control gate are formed from the plurality oflayers.
 22. The method of claim 18 wherein the select gate dielectricand the first peripheral transistor gate dielectric are formed byoxidation of the semiconductor substrate.
 23. The method of claim 22wherein the select gate dielectric and the first peripheral transistorgate dielectric consist of silicon oxide.
 24. The method of claim 18further comprising, after the operation (b), forming a dielectric(“floating gate dielectric”) on the semiconductor substrate to separatethe floating gate from the substrate, wherein the floating gatedielectric is formed of the same material as the select gate dielectricbut is thinner than the select gate dielectric.
 25. The method of claim18 wherein the second peripheral transistor gate dielectric is thinnerthan the first peripheral transistor gate dielectric.
 26. The method ofclaim 18 wherein the second peripheral transistor gate dielectric isformed before the operation (b).
 27. The method of claim 18 wherein thegate of the second peripheral transistor is formed by patterning thefirst layer in the operation (b).
 28. A method for fabricating anintegrated circuit comprising a nonvolatile memory comprising anonvolatile memory cell comprising a floating gate, a select gate, and acontrol gate, the nonvolatile memory further comprising a firstperipheral transistor, the method comprising: (a) forming a dielectriclayer on a semiconductor substrate, the dielectric layer comprising afirst dielectric region (“select gate dielectric”) and a seconddielectric region (“first peripheral transistor gate dielectric”),wherein the select gate dielectric and the first peripheral transistorgate dielectric are formed simultaneously; (b) forming a first layerover the dielectric layer and patterning the first layer to provide (i)the select gate on the select gate dielectric, and (ii) a gate for thefirst peripheral transistor on the first peripheral transistor gatedielectric; (c) after the operation (b), forming the floating gate andthe control gate for the memory cell; wherein the method furthercomprises forming a second peripheral transistor gate dielectric on thesemiconductor substrate for a second peripheral transistor, and forminga gate of the second peripheral transistor on the second peripheraltransistor gate dielectric, wherein the second peripheral transistorgate dielectric is made from the same material as the select gatetransistor gate dielectric and the first peripheral transistor gatedielectric but the thickness of the second peripheral transistor gatedielectric is different from the thickness of the first peripheraltransistor gate dielectric; wherein the gate of the second peripheraltransistor is formed by patterning the first layer in the operation (b).29. The method of claim 28 wherein the memory cell comprises a channelregion in the semiconductor substrate, the select gate controls aconductivity of a portion of the channel region, and the floating gateoverlies another portion of the channel region.
 30. The method of claim29 wherein the control gate overlies the floating gate.
 31. The methodof claim 28 wherein the operation (b) comprises forming a plurality oflayers over the semiconductor substrate, wherein the floating gate andthe control gate are formed from the plurality of layers.
 32. The methodof claim 28 wherein the select gate dielectric and the first peripheraltransistor gate dielectric are formed by oxidation of the semiconductorsubstrate.
 33. The method of claim 32 wherein the select gate dielectricand the first peripheral transistor gate dielectric consist of siliconoxide.
 34. The method of claim 28 further comprising, after theoperation (b), forming a dielectric (“floating gate dielectric”) on thesemiconductor substrate to separate the floating gate from thesubstrate, wherein the floating gate dielectric is formed of the samematerial as the select gate dielectric but is thinner than the selectgate dielectric.
 35. The method of claim 28 wherein the secondperipheral transistor gate dielectric is thinner than the firstperipheral transistor gate dielectric.
 36. The method of claim 28wherein the second peripheral transistor gate dielectric is formedbefore the operation (b).
 37. A method for fabricating an integratedcircuit comprising a nonvolatile memory comprising a nonvolatile memorycell comprising a floating gate, a select gate, and a control gate, thenonvolatile memory further comprising a first peripheral transistor, themethod comprising: (a) forming a dielectric layer on a semiconductorsubstrate, the dielectric layer comprising a first dielectric region(“select gate dielectric”) and a second dielectric region (“firstperipheral transistor gate dielectric”), wherein the select gatedielectric and the first peripheral transistor gate dielectric areformed simultaneously; (b) forming a first layer over the dielectriclayer and patterning the first layer to provide (i) the select gate onthe select gate dielectric, and (ii) a gate for the first peripheraltransistor on the first peripheral transistor gate dielectric; (c) afterthe operation (b), forming the floating gate and the control gate forthe memory cell; wherein the method further comprises forming a secondperipheral transistor gate dielectric on the semiconductor substrate fora second peripheral transistor, and forming a gate of the secondperipheral transistor on the second peripheral transistor gatedielectric, wherein the second peripheral transistor gate dielectric ismade from the same material as the select gate transistor gatedielectric and the first peripheral transistor gate dielectric but thethickness of the second peripheral transistor gate dielectric isdifferent from the thickness of the first peripheral transistor gatedielectric; wherein at least a portion of the select gate dielectric andat least a portion of the second peripheral transistor gate dielectricare formed simultaneously.
 38. The method of claim 37 wherein the secondperipheral transistor gate dielectric and a portion of the firstperipheral transistor gate dielectric are formed simultaneously.
 39. Themethod of claim 37 wherein the memory cell comprises a channel region inthe semiconductor substrate, the select gate controls a conductivity ofa portion of the channel region, and the floating gate overlies anotherportion of the channel region.
 40. The method of claim 39 wherein thecontrol gate overlies the floating gate.
 41. The method of claim 37wherein the operation (b) comprises forming a plurality of layers overthe semiconductor substrate, wherein the floating gate and the controlgate are formed from the plurality of layers.
 42. The method of claim 37wherein the select gate dielectric and the first peripheral transistorgate dielectric are formed by oxidation of the semiconductor substrate.43. The method of claim 42 wherein the select gate dielectric and thefirst peripheral transistor gate dielectric consist of silicon oxide.44. The method of claim 37 further comprising, after the operation (b),forming a dielectric (“floating gate dielectric”) on the semiconductorsubstrate to separate the floating gate from the substrate, wherein thefloating gate dielectric is formed of the same material as the selectgate dielectric but is thinner than the select gate dielectric.
 45. Themethod of claim 37 wherein the second peripheral transistor gatedielectric is thinner than the first peripheral transistor gatedielectric.
 46. The method of claim 37 wherein the select gatedielectric as at least as thick as a gate dielectric of any peripheraltransistor in said memory.
 47. The method of claim 37 wherein the secondperipheral transistor gate dielectric is formed after the start of theoperation (a).
 48. The method of claim 37 wherein the second peripheraltransistor gate dielectric is formed before the operation (b).
 49. Themethod of claim 37 wherein the gate of the second peripheral transistoris formed by patterning the first layer in the operation (b).
 50. Themethod of claim 37 wherein the memory cell is one of a plurality ofnonvolatile memory cells of said memory, each memory cell comprising afloating gate, a select gate, and a control gate, wherein: the operation(a) simultaneously forms select gate dielectric for each of the memorycells; and the operation (b) simultaneously forms the select gate foreach of the memory cells on the corresponding select gate dielectric.51. The method of claim 37 wherein during a memory cell writingoperation, the first peripheral transistor is exposed to a voltage of ahigher magnitude than any voltage provided to the memory cell in areading operation.
 52. The method of claim 51 wherein during the memorycell writing operation, the first peripheral transistor is exposed to avoltage of a higher magnitude than any power supply voltage provided tothe nonvolatile memory.
 53. The method of claim 37 wherein the memory isto support a writing operation in which the memory cell is written by atransfer of a charge between the floating gate and a channel region ofthe memory cell, the channel region being located in the semiconductorsubstrate.
 54. A method for fabricating an integrated circuit comprisinga nonvolatile memory comprising a nonvolatile memory cell comprising afloating gate, a select gate, and a control gate, the nonvolatile memoryfurther comprising a first peripheral transistor, the method comprising:(a) forming a dielectric layer on a semiconductor substrate, thedielectric layer comprising a first dielectric region (“select gatedielectric”) and a second dielectric region (“first peripheraltransistor gate dielectric”), wherein the select gate dielectric and thefirst peripheral transistor gate dielectric are formed simultaneously;(b) forming a first layer over the dielectric layer and patterning thefirst layer to provide (i) the select gate on the select gatedielectric, and (ii) a gate for the first peripheral transistor on thefirst peripheral transistor gate dielectric; (c) after the operation(b), forming the floating gate and the control gate for the memory cell;wherein the memory cell is one of a plurality of nonvolatile memorycells of said memory, each memory cell comprising a floating gate, aselect gate, and a control gate, wherein: the operation (a)simultaneously forms select gate dielectric for each of the memorycells; and the operation (b) simultaneously forms the select gate foreach of the memory cells on the corresponding select gate dielectric.55. The method of claim 54 wherein each memory cell comprises a channelregion in the semiconductor substrate, the select gate of the memorycell controls a conductivity of a portion of the channel region, and thefloating gate of the memory cell overlies another portion of the channelregion.
 56. The method of claim 55 wherein the control gate of eachmemory cell overlies the floating gate of the memory cell.
 57. Themethod of claim 54 wherein the operation (b) comprises forming aplurality of layers over the semiconductor substrate, wherein thefloating gates and the control gates are formed from the plurality oflayers.
 58. The method of claim 54 wherein the select gate dielectricand the first peripheral transistor gate dielectric are formed byoxidation of the semiconductor substrate.
 59. The method of claim 58wherein the select gate dielectric and the first peripheral transistorgate dielectric consist of silicon oxide.
 60. The method of claim 54further comprising, after the operation (b), forming a dielectric(“floating gate dielectric”) on the semiconductor substrate to separatethe floating gates from the substrate, wherein the floating gatedielectric is formed of the same material as the select gate dielectricbut is thinner than the select gate dielectric.
 61. The method of claim54 further comprising forming a second peripheral transistor gatedielectric on the semiconductor substrate for a second peripheraltransistor, and forming a gate of the second peripheral transistor onthe second peripheral transistor gate dielectric, wherein the secondperipheral transistor gate dielectric is made from the same material asthe select gate transistor gate dielectric and the first peripheraltransistor gate dielectric but the thickness of the second peripheraltransistor gate dielectric is different from the thickness of the firstperipheral transistor gate dielectric.
 62. The method of claim 61wherein the second peripheral transistor gate dielectric is thinner thanthe first peripheral transistor gate dielectric.
 63. The method of claim61 wherein the select gate dielectric as at least as thick as a gatedielectric of any peripheral transistor in said memory.
 64. The methodof claim 61 wherein the second peripheral transistor gate dielectric isformed after the start of the operation (a).
 65. The method of claim 61wherein the second peripheral transistor gate dielectric is formedbefore the operation (b).
 66. The method of claim 61 wherein the gate ofthe second peripheral transistor is formed by patterning the first layerin the operation (b).
 67. The method of claim 54 wherein during a memorycell writing operation, the first peripheral transistor is exposed to avoltage of a higher magnitude than any voltage provided to the memorycell in a reading operation.
 68. The method of claim 67 wherein duringthe memory cell writing operation, the first peripheral transistor isexposed to a voltage of a higher magnitude than any power supply voltageprovided to the nonvolatile memory.
 69. The method of claim 54 whereinthe memory is to support a writing operation in which a memory cell iswritten by a transfer of a charge between its floating gate and achannel region of the memory cell, the channel region being located inthe semiconductor substrate.
 70. A method for fabricating an integratedcircuit comprising a nonvolatile memory comprising a nonvolatile memorycell comprising a floating gate, a select gate, and a control gate, thenonvolatile memory further comprising a first peripheral transistor, themethod comprising: (a) forming a dielectric layer on a semiconductorsubstrate, the dielectric layer comprising a first dielectric region(“select gate dielectric”) and a second dielectric region (“firstperipheral transistor gate dielectric”), wherein the select gatedielectric and the first peripheral transistor gate dielectric areformed simultaneously; (b) forming a first layer over the dielectriclayer and patterning the first layer to provide (i) the select gate onthe select gate dielectric, and (ii) a gate for the first peripheraltransistor on the first peripheral transistor gate dielectric; (c) afterthe operation (b), forming the floating gate and the control gate forthe memory cell; wherein during a memory cell writing operation, thefirst peripheral transistor is exposed to a voltage of a highermagnitude than any voltage provided to the memory cell in a readingoperation.
 71. The method of claim 70 wherein the memory cell comprisesa channel region in the semiconductor substrate, the select gatecontrols a conductivity of a portion of the channel region, and thefloating gate overlies another portion of the channel region.
 72. Themethod of claim 71 wherein the control gate overlies the floating gate.73. The method of claim 70 wherein the operation (b) comprises forming aplurality of layers over the semiconductor substrate, wherein thefloating gate and the control gate are formed from the plurality oflayers.
 74. The method of claim 70 wherein the select gate dielectricand the first peripheral transistor gate dielectric are formed byoxidation of the semiconductor substrate.
 75. The method of claim 74wherein the select gate dielectric and the first peripheral transistorgate dielectric consist of silicon oxide.
 76. The method of claim 70further comprising, after the operation (b), forming a dielectric(“floating gate dielectric”) on the semiconductor substrate to separatethe floating gate from the substrate, wherein the floating gatedielectric is formed of the same material as the select gate dielectricbut is thinner than the select gate dielectric.
 77. The method of claim70 further comprising forming a second peripheral transistor gatedielectric on the semiconductor substrate for a second peripheraltransistor, and forming a gate of the second peripheral transistor onthe second peripheral transistor gate dielectric, wherein the secondperipheral transistor gate dielectric is made from the same material asthe select gate transistor gate dielectric and the first peripheraltransistor gate dielectric but the thickness of the second peripheraltransistor gate dielectric is different from the thickness of the firstperipheral transistor gate dielectric.
 78. The method of claim 77wherein the second peripheral transistor gate dielectric is thinner thanthe first peripheral transistor gate dielectric.
 79. The method of claim77 wherein the select gate dielectric as at least as thick as a gatedielectric of any peripheral transistor in said memory.
 80. The methodof claim 77 wherein the second peripheral transistor gate dielectric isformed after the start of the operation (a).
 81. The method of claim 77wherein the second peripheral transistor gate dielectric is formedbefore the operation (b).
 82. The method of claim 77 wherein the gate ofthe second peripheral transistor is formed by patterning the first layerin the operation (b).
 83. The method of claim 70 wherein during thememory cell writing operation, the first peripheral transistor isexposed to a voltage of a higher magnitude than any power supply voltageprovided to the nonvolatile memory.
 84. The method of claim 83 whereinthe memory is to support a writing operation in which the memory cell iswritten by a transfer of a charge between the floating gate and achannel region of the memory cell, the channel region being located inthe semiconductor substrate.
 85. The method of claim 70 wherein thememory is to support a writing operation in which the memory cell iswritten by a transfer of a charge between the floating gate and achannel region of the memory cell, the channel region being located inthe semiconductor substrate.
 86. A method for fabricating an integratedcircuit comprising a nonvolatile memory comprising a nonvolatile memorycell comprising a floating gate, a select gate, and a control gate, thenonvolatile memory further comprising a first peripheral transistor, themethod comprising: (a) forming a dielectric layer on a semiconductorsubstrate, the dielectric layer comprising a first dielectric region(“select gate dielectric”) and a second dielectric region (“firstperipheral transistor gate dielectric”), wherein the select gatedielectric and the first peripheral transistor gate dielectric areformed simultaneously; (b) forming a first layer over the dielectriclayer and patterning the first layer to provide (i) the select gate onthe select gate dielectric, and (ii) a gate for the first peripheraltransistor on the first peripheral transistor gate dielectric; (c) afterthe operation (b), forming the floating gate and the control gate forthe memory cell; wherein the memory is to support a writing operation inwhich the memory cell is written by a transfer of a charge between thefloating gate and a channel region of the memory cell, the channelregion being located in the semiconductor substrate.
 87. The method ofclaim 86 wherein the memory cell comprises a channel region in thesemiconductor substrate, the select gate controls a conductivity of aportion of the channel region, and the floating gate overlies anotherportion of the channel region.
 88. The method of claim 87 wherein thecontrol gate overlies the floating gate.
 89. The method of claim 86wherein the operation (b) comprises forming a plurality of layers overthe semiconductor substrate, wherein the floating gate and the controlgate are formed from the plurality of layers.
 90. The method of claim 86wherein the select gate dielectric and the first peripheral transistorgate dielectric are formed by oxidation of the semiconductor substrate.91. The method of claim 90 wherein the select gate dielectric and thefirst peripheral transistor gate dielectric consist of silicon oxide.92. The method of claim 86 further comprising, after the operation (b),forming a dielectric (“floating gate dielectric”) on the semiconductorsubstrate to separate the floating gate from the substrate, wherein thefloating gate dielectric is formed of the same material as the selectgate dielectric but is thinner than the select gate dielectric.
 93. Themethod of claim 86 further comprising forming a second peripheraltransistor gate dielectric on the semiconductor substrate for a secondperipheral transistor, and forming a gate of the second peripheraltransistor on the second peripheral transistor gate dielectric, whereinthe second peripheral transistor gate dielectric is made from the samematerial as the select gate transistor gate dielectric and the firstperipheral transistor gate dielectric but the thickness of the secondperipheral transistor gate dielectric is different from the thickness ofthe first peripheral transistor gate dielectric.
 94. The method of claim93 wherein the second peripheral transistor gate dielectric is thinnerthan the first peripheral transistor gate dielectric.
 95. The method ofclaim 93 wherein the select gate dielectric as at least as thick as agate dielectric of any peripheral transistor in said memory.
 96. Themethod of claim 93 wherein the second peripheral transistor gatedielectric is formed after the start of the operation (a).
 97. Themethod of claim 93 wherein the second peripheral transistor gatedielectric is formed before the operation (b).
 98. The method of claim93 wherein the gate of the second peripheral transistor is formed bypatterning the first layer in the operation (b).